METROLOGY IN SCANNING PROBE MICROSCOPY WI TH ATOMIC-FORCE MICROSCOPY AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Authors
ZURMUHLEN E MUNOZ M GEHRING S REINEKE F
Citation
E. Zurmuhlen et al., METROLOGY IN SCANNING PROBE MICROSCOPY WI TH ATOMIC-FORCE MICROSCOPY AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY, European journal of cell biology, 74, 1997, pp. 72-72
Citations number
NO
Categorie Soggetti
Cell Biology
Journal title
European journal of cell biology → ACNP
ISSN journal
01719335
Volume
74
Year of publication
1997
Supplement
45
Pages
72 - 72
Database
ISI
SICI code
0171-9335(1997)74:<72:MISPMW>2.0.ZU;2-A