XTEM ANALYSIS OF GE NANOCLUSTERS IN THIN SIO2 LAYERS

Citation
A. Markwitz et al., XTEM ANALYSIS OF GE NANOCLUSTERS IN THIN SIO2 LAYERS, European journal of cell biology, 74, 1997, pp. 122-122
Citations number
NO
Categorie Soggetti
Cell Biology
ISSN journal
01719335
Volume
74
Year of publication
1997
Supplement
45
Pages
122 - 122
Database
ISI
SICI code
0171-9335(1997)74:<122:XAOGNI>2.0.ZU;2-G