STUDY OF MAGNETIC-PROPERTIES OF MAGNETIC FORCE MICROSCOPY PROBES USING MICRONSCALE CURRENT RINGS

Authors
Citation
Ls. Kong et Sy. Chou, STUDY OF MAGNETIC-PROPERTIES OF MAGNETIC FORCE MICROSCOPY PROBES USING MICRONSCALE CURRENT RINGS, Journal of applied physics, 81(8), 1997, pp. 5026-5028
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
8
Year of publication
1997
Part
2B
Pages
5026 - 5028
Database
ISI
SICI code
0021-8979(1997)81:8<5026:SOMOMF>2.0.ZU;2-P
Abstract
Metal rings with inner diameters of 1 and 5 mu m, fabricated using ele ctron-beam lithography, were used to calibrate magnetic force microsco py (MFM). A MFM tip's effective magnetic charge, q, and effective magn etic moment along the tip long axis, m(z), can be determined by the cu rrent flowing in the ring. The magnetic moments in the directions tran sverse to the tip's long axis were estimated by a straight current wir e. It was found that for a silicon tip coated with 65 nm thick cobalt on the side, q = 2.8 x 10(-6) emu/cm, m(z) = 3.8 x 10(-9) emu, and m(x ) = m(y) = 10(-13) emu, which are negligible compared with m(z). Furth ermore, the tip's sensitivity to the second derivative of the magnetic field was found to be about 0.1 Oe/nm(2). (C) 1997 American Institute of Physics.