Ls. Kong et Sy. Chou, STUDY OF MAGNETIC-PROPERTIES OF MAGNETIC FORCE MICROSCOPY PROBES USING MICRONSCALE CURRENT RINGS, Journal of applied physics, 81(8), 1997, pp. 5026-5028
Metal rings with inner diameters of 1 and 5 mu m, fabricated using ele
ctron-beam lithography, were used to calibrate magnetic force microsco
py (MFM). A MFM tip's effective magnetic charge, q, and effective magn
etic moment along the tip long axis, m(z), can be determined by the cu
rrent flowing in the ring. The magnetic moments in the directions tran
sverse to the tip's long axis were estimated by a straight current wir
e. It was found that for a silicon tip coated with 65 nm thick cobalt
on the side, q = 2.8 x 10(-6) emu/cm, m(z) = 3.8 x 10(-9) emu, and m(x
) = m(y) = 10(-13) emu, which are negligible compared with m(z). Furth
ermore, the tip's sensitivity to the second derivative of the magnetic
field was found to be about 0.1 Oe/nm(2). (C) 1997 American Institute
of Physics.