THE INFLUENCE OF THE PT BUFFER LAYER ON THE PERPENDICULAR MAGNETIC-ANISOTROPY IN EPITAXIAL FEPD(001) ORDERED ALLOYS GROWN BY SPUTTERING

Citation
P. Caro et al., THE INFLUENCE OF THE PT BUFFER LAYER ON THE PERPENDICULAR MAGNETIC-ANISOTROPY IN EPITAXIAL FEPD(001) ORDERED ALLOYS GROWN BY SPUTTERING, Journal of applied physics, 81(8), 1997, pp. 5050-5052
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
8
Year of publication
1997
Part
2B
Pages
5050 - 5052
Database
ISI
SICI code
0021-8979(1997)81:8<5050:TIOTPB>2.0.ZU;2-V
Abstract
Single-crystalline FePd(001) 1000-Angstrom-thick films were grown at 5 00 degrees C by codeposition in an UHV sputtering system. It is found that both the crystalline structure and therefore the magnetic propert ies strongly depend on the Pt buffer layer thickness. The films grown on Pt(100) layers 50 Angstrom thick and thinner do not exhibit clear c hemical order and show in-plane magnetic anisotropy. FePd grown on thi cker Pt buffers adopts a fct structure accompanied by a strong chemica l ordering, leading to a perpendicular magnetic anisotropy. (C) 1997 A merican Institute of Physics.