MAGNETIC AND MAGNETOOPTICAL INVESTIGATION OF COCRTA AND COCRPT FILMS

Magnetic and magneto-optic measurements (polar Kerr rotation and ellip ticity) have been taken for a series of CoCrTa and CoCrPt single layer films with different thicknesses. The magnetic layers were rf sputter deposited onto constant thickness titanium layers on glass substrates at room temperature. Experimental data were obtained at two different wavelengths, i.e., 825 and 670 nm. The perpendicular coercivity H-c m easured at the two wavelengths increased with film thickness. Converse ly, the lower thickness showed the highest theta(k) and this decreased as the thickness increases. The opposite trend has been noticed for C oCrPt films. There is no difference in the grain size from transmissio n electron microscopy examination. The results of the investigation ar e presented in the context of the need for magneto-optic material to b e optimized for short wavelength applications in the future. (C) 1997 American Institute of Physics.