Technology computer-aided design (TCAD) is essential to the design of
modem integrated circuit fabrication processes. TCAD tools must not on
ly model real processes accurately, to allow predictive simulation dur
ing technology research and development, but they must work together a
s an integrated system to allow efficient exploration of technology op
tions. Sensitivity and statistical analyses using an integrated TCAD s
ystem provide rapid technology characterization, including the examina
tion of process extremes, before fabrication. This predictive capabili
ty reduces the technology design interval, and enables the design of o
ptimized, manufacturable designs. This paper describes the integrated
TCAD system in use at AT & T.