A compact on-chip error correcting circuit (ECC) for low cost Flash me
mories has been developed,The total increase in chip area is 2%, inclu
ding all cells, sense amplifiers, logic, and wiring associated with th
e ECC, The proposed on-chip ECC, employing 10 check bits for 512 data
bits, has been implemented on an experimental 64M-bit NAND Flash memor
y, The cumulative sector error rate has been improved from 10(-1) to 1
0(-10). By transferring read data from the sense amplifiers to the ECC
twice, 522-Byte temporary buffers, which are required for the convent
ional ECC and occupy a large part of tile ECC area, have been eliminat
ed, As a result, the area for the circuit has been drastically reduced
by a factor of 25, The proposed on-chip ECC has been optimized in con
sideration of balance between the reliability improvement and the cell
area overhead, The power increase has been suppressed to less than 1
mA.