MODELING HIGH-CONCENTRATION BORON-DIFFUSION WITH DYNAMIC CLUSTERING -INFLUENCE OF THE INITIAL CONDITIONS

Citation
B. Baccus et E. Vandenbossche, MODELING HIGH-CONCENTRATION BORON-DIFFUSION WITH DYNAMIC CLUSTERING -INFLUENCE OF THE INITIAL CONDITIONS, Microelectronics, 26(2-3), 1995, pp. 235-242
Citations number
17
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00262692
Volume
26
Issue
2-3
Year of publication
1995
Pages
235 - 242
Database
ISI
SICI code
0026-2692(1995)26:2-3<235:MHBWDC>2.0.ZU;2-Q
Abstract
Boron diffusion and activation at high concentrations are key problems in the formation of shallow P+ junctions. Therefore, it is necessary to understand and to predict accurately the dopant behaviour under the se conditions. In this paper, the modelling of boron is discussed, by the use of a non-equilibrium point-defect model, including amorphizati on and a dynamic clustering component. The initial conditions are of m ajor importance, not only for the transient enhanced diffusion, but al so for the amount of active dopants. As a result, it is possible to ob tain activation levels greater than the solid solubility, as observed experimentally.