C. Coluzza, SPECTROMICROSCOPY AND CHEMICAL IMAGING APPLIED TO THE STUDY OF PHOTOCATHODE MATERIALS AND DEVICES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 387(1-2), 1997, pp. 24-32
We applied different and complementary techniques to study the surface
and interface local properties of materials (such as cesium iodide) a
nd devices that are used for photodetection. These techniques, based o
n the photoexcitation of electrons, allowed us to correlate the local
chemical and morphological properties of materials with their quantum
efficiency: a crucial step for the optimization of large area photodet
ectors. We also present some experimental results achieved by a novel
spectroscopic technique: local phototransport measurements by Scanning
Near-Field Optical Microscopy (SNOM). This technique is able to overc
ome the diffraction limit for the lateral resolution and to supply inf
ormation on the local photoconductivity as well as on the local proper
ties of buried interfaces with a spatial resolution better than 50 nm.
Both types of information are important for the study of devices used
for a spatially resolved photodetection.