Jb. Parise et J. Chen, STUDIES OF CRYSTALLINE SOLIDS AT HIGH-PRESSURE AND TEMPERATURE USING THE DIA MULTI-ANVIL APPARATUS, European journal of solid state and inorganic chemistry, 34(7-8), 1997, pp. 809-821
Large volume high pressure devices of the DIA-type have been interface
d with high energy synchrotron X-radiation at the MAX-80 facility at t
he KEK in Japan and at the SAM-85 facility at the National Synchrotron
Light Source. The optics and detectors at these installations are opt
imized for rapid switching between monochromatic and energy dispersive
modes of operation. This allows routine exploration of phase diagrams
at high pressures and temperatures along with the determination of st
ructure from high resolution powder diffraction data. The addition of
translating imaging plates makes possible the determination of the kin
etic parameters for phase transitions and order-disorder phenomena fro
m real-time data.