ELECTRON-MICROSCOPY AND X-RAY-ANALYSIS OF TZP MATRIX COMPOSITES

Authors
FARYNA M PEDZICH Z BUCKO MM HABERKO K
Citation
M. Faryna et al., ELECTRON-MICROSCOPY AND X-RAY-ANALYSIS OF TZP MATRIX COMPOSITES, Journal of trace and microprobe techniques, 15(4), 1997, pp. 459-465
Citations number
5
Journal title
Journal of trace and microprobe techniques → ACNP
ISSN journal
07334680
Volume
15
Issue
4
Year of publication
1997
Pages
459 - 465
Database
ISI
SICI code
0733-4680(1997)15:4<459:EAXOTM>2.0.ZU;2-I
Abstract
Yttria stabilised tetragonal zirconia polycrystals (Y-TZP) show high f racture toughness and strength. However, relatively low hardness limit s their potential application. This property can be improved by the in corporation of hard carbide inclusions into the Y-TZP matrix. The aim of this work is to present the application of different electron micro scopy and X-ray analysis techniques to the material under discussion.