CATHODOLUMINESCENCE SCANNING MICROSCOPY

In semiconducting materials for lasers and light emitting diodes the r adiative recombination processes are of a great importance. The effici ency of these processes strongly depends on the presence of structure defects which have usually nonuniform distribution and cause inhomogen eities of radiation features of the material. The cathodoluminescence scanning microscopy or cathodoluminescence mode of scanning electron m icroscope enables us to control the luminescence properties of solids on microscale level. It is very important to know possibilities and in formation capacity of this method.