ELECTRON THERMAL EFFECTS AND NEW TECHNIQUES OF MICROBEAM ANALYSIS IN SEM

Authors
Citation
Jp. Yin et al., ELECTRON THERMAL EFFECTS AND NEW TECHNIQUES OF MICROBEAM ANALYSIS IN SEM, Journal of trace and microprobe techniques, 15(4), 1997, pp. 607-611
Citations number
6
ISSN journal
07334680
Volume
15
Issue
4
Year of publication
1997
Pages
607 - 611
Database
ISI
SICI code
0733-4680(1997)15:4<607:ETEANT>2.0.ZU;2-M
Abstract
Electron thermoacoustic effect, electron thermoradiometry effect and t he principles of imaging in SEM are described and discussed. A new tec hnique of scanning electron thermoradiometry (SETR) and a new combined use of the technique of SETR and scanning electron thermoacoustic (SE TA) microscopy are proposed. The energy distribution of SETR and SETA signals are analyzed.