AN XPS AND BAW SENSOR STUDY OF THE STRUCTURE AND REAL-TIME GROWTH-BEHAVIOR OF A COMPLEX SURFACE-FILM ON COPPER IN SODIUM-CHLORIDE SOLUTIONS(PH=9), CONTAINING A LOW CONCENTRATION OF BENZOTRIAZOLE

The structures and growth kinetics of the complex surface films on cop per in sodium chloride solutions (pH = 9) containing low concentration s of benzotriazole have been studied by X-ray photo-electron spectrosc opy and a BAW sensor. It is shown that there are some differences in g rowth kinetics and structures for these surface complex films, even th ough the copper surfaces prior to the contact with BTA are of the same state and the treated solutions have a same pH value (pH = 9). When t he BTA concentration (C-BTA) in the treating solution is zero, low (< 0.17 mM) and high (greater than or equal to 0.17 mM), the film growth can be best represented by a linear, parabolic and logarithmic law, re spectively; and the corresponding structures of the surface films of c opper are the multilayer structure of Cu/Cu-Cu2O, Cu/Cu-Cu2O/CuO-Cu(I) BTA and Cu/Cu-Cu2O-Cu(I)BTA, respectively. With C-BTA increasing, the growth kinetics of the surface film changes from a parabolic law to a logarithmic law, the critical concentration of BTA is 0.17 mM, above w hich CuO cannot be detected in the surface film and a higher inhibitio n efficiency can be obtained. (C) 1997 Elsevier Science Ltd.