OXYGEN-ADSORPTION ON THIN COBALT FILMS - AN AUGER AND WORK FUNCTION STUDY

Citation
G. Benitez et al., OXYGEN-ADSORPTION ON THIN COBALT FILMS - AN AUGER AND WORK FUNCTION STUDY, Vacuum, 48(7-9), 1997, pp. 651-653
Citations number
13
Categorie Soggetti
Physics, Applied","Material Science
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
48
Issue
7-9
Year of publication
1997
Pages
651 - 653
Database
ISI
SICI code
0042-207X(1997)48:7-9<651:OOTCF->2.0.ZU;2-5
Abstract
The adsorption of oxygen by thin cobalt films supported on oxidized Si (100) was studied at 300 K using Auger electron spectroscopy (AES) and work function changes (Delta phi). The films were prepared in separat e UHV-systems either by vapor deposition (PVD) or by pulsed laser abla tion (PLA). The oxygen saturation exposure depends on the preparation method: in PVD-films at least 100 L are needed, while in films deposit ed by PLA only 10 L are required. However, films prepared by PLA, but on cleaved muscovite, showed uptake curves saturating at approximate t o 80 L as in evaporated films. The work function changes upon oxygen a dsorption showed an initial increase of 0.2 eV, followed by a steep de crease, saturating at approximate to - 1.2 eV. An oxide formation is c learly demonstrated by the AES MVV spectra of Co at exposures above 9 L. (C) 1997 Elsevier Science Ltd.