The tracer diffusion coefficient of In-111 has been investigated in th
e chalcopyrite CuInS2 at 650 degrees C for different sulfur partial pr
essures p(s2). The unusual shape of the profiles are attributed to two
different volume diffusion processes of indium in the compound giving
rise to two diffusion coefficients D-1 and D-2*. The observed decrea
se of the tracer diffusion coefficients with increasing P-s2 is discus
sed in respect to the point defect structure of CuInS2 and the migrati
on mechanisms of cations in the chalcopyrite structure.