STRUCTURAL-ANALYSIS OF IMPERFECT CRYSTAL-SURFACES BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION - ANTIPHASE DOMAINS OF A SI(111)(ROOT-3X-ROOT-3)-AG SURFACE

Authors
ICHIMIYA A OHNO Y
Citation
A. Ichimiya et Y. Ohno, STRUCTURAL-ANALYSIS OF IMPERFECT CRYSTAL-SURFACES BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION - ANTIPHASE DOMAINS OF A SI(111)(ROOT-3X-ROOT-3)-AG SURFACE, Surface review and letters, 4(5), 1997, pp. 985-990
Citations number
8
Journal title
Surface review and letters → ACNP
ISSN journal
0218625X
Volume
4
Issue
5
Year of publication
1997
Pages
985 - 990
Database
ISI
SICI code
0218-625X(1997)4:5<985:SOICBR>2.0.ZU;2-6
Abstract
For dynamical calculations of reflection high-energy electron diffract ion (RHEED) for imperfect crystal surfaces, a general formula of Fouri er coefficients of crystal potential with domain structures is develop ed. Using the formula, RHEED intensity rocking curves are calculated f or a Si(111)(root 3 x root 3)-Ag surface with antiphase domains. We di scuss effects of antiphase domains of surfaces in structure determinat ions by RHEED.