Ma. Akhter et al., THICKNESS AND GRAIN-SIZE DEPENDENCE OF THE COERCIVITY IN PERMALLOY THIN-FILMS, Journal of applied physics, 81(8), 1997, pp. 4122-4124
This paper reports the effect of thickness and grain size on the coerc
ivity of Ni81Fe19 permalloy thin films (2.5-30 nm) sputtered on glass
substrates for their application in magnetoresistive sensors. Coercivi
ty was systematically investigated as a function of underlayer materia
ls, thickness, and substrate temperature. Lateral grain size of the sp
uttered films was investigated, The grain size reduced very quickly in
the thinner films. It was also found that the coercivity of the films
with very small lateral grain size is much lower than those with a no
rmal grain size, The lowest coercivity (H-c=0.8 Oe) was observed in 7.
5 nm thick film and having a grain size of 4 nm. When an underlayer is
used, its crystallinity affects the lateral grain size in the permall
oy and correlates with the observed coercivity variation [P. Galtier,
R. Jerome, and T. Valet, Mater. Res. Sec. Symp. Proc. 313, 417 (1993).
] It was also observed that the coercivity of the permalloy is depende
nt on the nature of the underlayer. It was established that the coerci
vity of Ni81Fe19 films increases when the thickness increased from a c
ritical film thickness and grain size. The variation of the coercivity
in thin Ni81Fe19 films with lateral grain size and relationship with
domain-wall width is discussed and compared with other theories for ma
gnetization reversal. (C) 1997 American Institute of Physics.