It is shown that the annealing under Ar of sputtered WSx amorphous fil
ms deposited on Ni coated substrates gives bidimensional polycrystalli
ne 2H-WS2 films. Ni enhances the formation of large crystallites. The
temperature dependence of the mobility and its dependence versus the N
i content clearly show that transport properties are governed by grain
boundaries. A basic grain boundary model like the model of Seto is we
ll suited to explain the electrical properties. The photoconductivity
enhancement resulting from nickel is assigned to a decrease of the num
ber of the electrical barriers. However, noise measurements are not co
nsistent with Hall measurements; a model is thus proposed to explain t
he 1/f noise excess in relation to the traces of Ni-W revealed by x-ra
y diffraction. (C) 1997 American Institute of Physics.