ASSEMBLY AND IMAGING OF SUBMICRON FERROMAGNETS IN GAAS

Citation
J. Shi et al., ASSEMBLY AND IMAGING OF SUBMICRON FERROMAGNETS IN GAAS, Journal of applied physics, 81(8), 1997, pp. 4331-4335
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
8
Year of publication
1997
Part
2A
Pages
4331 - 4335
Database
ISI
SICI code
0021-8979(1997)81:8<4331:AAIOSF>2.0.ZU;2-B
Abstract
Submicron room-temperature ferromagnets are formed in GaAs semiconduct ors through a simple process of ion implantation and subsequent heat t reatment. The ferromagnetic structures are studied using magnetic forc e microscopy. Magnetization switching of single-domain particles has b een directly imaged in applied magnetic fields. In order to understand the images of magnetic structures taken under external fields, we hav e characterized the magnetic force microscopy (MFM) probes by imaging microfabricated current-carrying strips in applied magnetic fields. Pa tterned micrometer scale lines containing submicron magnetic structure s on GaAs are fabricated using lithography in conjunction with broad b eam ion implantation. (C) 1997 American Institute of Physics.