In this article, we present a study on the micromagnetics of exchange
biased Permalloy films. Specifically, by combining magnetic force micr
oscopy with micromagnetic modeling simulation, the magnetization rever
sal processes in exchange biased Permalloy films were studied. The bil
ayer films were lithographically patterned into micrometer scale recta
ngular elements. It is shown that the micromagnetic simulations accura
tely predict domain configurations during magnetization reversal of th
e exchange biased Permalloy film elements and provide detailed magneti
zation distributions and transient dynamic magnetization configuration
s that could not yet be obtained experimentally. The study found that,
for both NiO/NiFe and FeMn/NiFe systems, the exchange bias field meas
ured on individual patterned micrometer scale bilayer film elements ca
n be significantly larger than that measured on the sheet film sample.
(C) 1997 American Institute of Physics.