MAGNETIC THIN-FILMS HAVING A LATERAL NANOSTRUCTURAL PERIODICITY

Citation
F. Nguyenvandau et al., MAGNETIC THIN-FILMS HAVING A LATERAL NANOSTRUCTURAL PERIODICITY, Journal of applied physics, 81(8), 1997, pp. 4482-4484
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
8
Year of publication
1997
Part
2A
Pages
4482 - 4484
Database
ISI
SICI code
0021-8979(1997)81:8<4482:MTHALN>2.0.ZU;2-P
Abstract
Magnetic and magnetoresistive properties of thin films deposited on pe riodically structured substrates are studied. We used a thermodynamica l heat treatment to activate the step bunching phenomena on vicinal Si (111) substrates misoriented towards [11 (2) over bar]. Then, Co or Fe Ni magnetic layers have been grown, with thicknesses ranging between 2 0 and 100 Angstrom. Transmission electron microscopy experiments revea l a lateral pseudoperiodic variation of the epitaxial relationship of the metallic layers. Magnetometry measurements reveal an in-plane unia xial magnetic anisotropy with the easy axis parallel to the step direc tion. We discuss the relative contributions of magnetocrystalline and shape effects to the anisotropy. Surprisingly, the angular dependance of the anisotropic magnetoresistance reveal a single-domain behavior a nd a magnetization reversal by rotation, with an active area as large as 700 mu mX100 mu m. We discuss the influence of the magnetic layer t hickness on the magnetization reversal process. (C) 1997 American Inst itute of Physics.