Magnetic and magnetoresistive properties of thin films deposited on pe
riodically structured substrates are studied. We used a thermodynamica
l heat treatment to activate the step bunching phenomena on vicinal Si
(111) substrates misoriented towards [11 (2) over bar]. Then, Co or Fe
Ni magnetic layers have been grown, with thicknesses ranging between 2
0 and 100 Angstrom. Transmission electron microscopy experiments revea
l a lateral pseudoperiodic variation of the epitaxial relationship of
the metallic layers. Magnetometry measurements reveal an in-plane unia
xial magnetic anisotropy with the easy axis parallel to the step direc
tion. We discuss the relative contributions of magnetocrystalline and
shape effects to the anisotropy. Surprisingly, the angular dependance
of the anisotropic magnetoresistance reveal a single-domain behavior a
nd a magnetization reversal by rotation, with an active area as large
as 700 mu mX100 mu m. We discuss the influence of the magnetic layer t
hickness on the magnetization reversal process. (C) 1997 American Inst
itute of Physics.