S. Subramanian et al., INTEGRITY OF III-V HETEROJUNCTION INTERFACES UNDER GAMMA-IRRADIATION, IEEE transactions on nuclear science, 44(6), 1997, pp. 1862-1869
Reliability of modern III-V semiconductor heterostructure devices mean
t for strong radiation environment depends upon the integrity of the h
etero-interfaces under radiation. In this paper, we present some resul
ts of our investigation of a variety of heterojunction structures subj
ected to gamma irradiation up to 40 Mrads (Si) probed by Hall, C-V and
photoluminescence measurements.