PROTON-INDUCED TRANSIENTS IN OPTOCOUPLERS - IN-FLIGHT ANOMALIES, GROUND IRRADIATION TEST, MITIGATION AND IMPLICATIONS

Citation
Ka. Label et al., PROTON-INDUCED TRANSIENTS IN OPTOCOUPLERS - IN-FLIGHT ANOMALIES, GROUND IRRADIATION TEST, MITIGATION AND IMPLICATIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 1885-1892
Citations number
21
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
1885 - 1892
Database
ISI
SICI code
0018-9499(1997)44:6<1885:PTIO-I>2.0.ZU;2-R
Abstract
We present data on recent optocoupler in-flight anomalies and the subs equent ground test irradiation performed. Discussions of the single ev ent mechanisms involved, transient filtering analysis, and design impl ications are included. Proton-induced transients were observed on high er speed optocouplers with a unique dependence on the incidence partic le angle. The results indicate that both direct ionization and nuclear reaction-related mechanisms are responsible for the single events obs erved.