LOW-DOSE RATE EFFECTS ON LINEAR BIPOLAR ICS - EXPERIMENTS ON THE TIME-DEPENDENCE

The time dependence of radiation-induced damage to a bipolar microcirc uit has been studied at three dose rates. It is found that both time d ependent effects and ''true'' dose rate effects must be considered to fully characterize the radiation response of these devices. Pal empiri cal model is constructed in an attempt to describe the response of the se devices both during and after the irradiation. It is found that thi s model can successfully characterize the time dependent effects obser ved in these devices, as well as demonstrate some fundamental differen ces in the radiation response at different dose rates. This model in i ts present form, however, is shown to be insufficient to explain the r esults of several experiments where the devices are subjected to seque nces of alternating irradiations and anneals. The consequences of thes e results and possible mechanisms are presented.