A PROPOSED HARDNESS ASSURANCE TEST METHODOLOGY FOR BIPOLAR LINEAR CIRCUITS AND DEVICES IN A SPACE IONIZING-RADIATION ENVIRONMENT

Authors
PEASE RL COHN LM FLEETWOOD DM GEHLHAUSEN MA TURFLINGER TL BROWN DB JOHNSTON AH
Citation
Rl. Pease et al., A PROPOSED HARDNESS ASSURANCE TEST METHODOLOGY FOR BIPOLAR LINEAR CIRCUITS AND DEVICES IN A SPACE IONIZING-RADIATION ENVIRONMENT, IEEE transactions on nuclear science, 44(6), 1997, pp. 1981-1988
Citations number
18
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
1981 - 1988
Database
ISI
SICI code
0018-9499(1997)44:6<1981:APHATM>2.0.ZU;2-L
Abstract
A hardness assurance test approach has been developed for bipolar line ar circuits and devices in space. It consists of an initial test for d ose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate. For parts wit h adequate design margin and/or well behaved parts a generic elevated temperature irradiation test is proposed.