ISOTHERMAL AND ISOCHRONAL ANNEALING METHODOLOGY TO STUDY POSTIRRADIATION TEMPERATURE ACTIVATED PHENOMENA

In this work, the evolution of the oxide trapped charge has been model ed, to predict post-irradiation behavior for arbitrary anneal conditio ns (i.e. arbitrary temperature-time profiles). Using experimental data obtained from a single isochronal anneal, the method consists of calc ulating the evolution of the energy distribution of the oxide trapped charge, in the framework of a thermally activated charge detrapping mo del. This methodology is illustrated in this paper by the prediction o f experimental isothermal data from isochronal measurements. The impli cations of these results to hardness assurance test methods are discus sed.