WORST-CASE TEST VECTORS FOR FUNCTIONAL FAILURE INDUCED BY TOTAL-DOSE IN CMOS MICROCIRCUITS WITH TRANSMISSION GATES

Authors
ABOUAUF AA BARBE DF RUSHDI MM
Citation
Aa. Abouauf et al., WORST-CASE TEST VECTORS FOR FUNCTIONAL FAILURE INDUCED BY TOTAL-DOSE IN CMOS MICROCIRCUITS WITH TRANSMISSION GATES, IEEE transactions on nuclear science, 44(6), 1997, pp. 2013-2017
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
2013 - 2017
Database
ISI
SICI code
0018-9499(1997)44:6<2013:WTVFFF>2.0.ZU;2-I
Abstract
Fault models for total-dose induced functional failure in CMOS microci rcuits containing transmission gates have been developed for the autom atic generation of worst-case test vectors.