DETERMINATION OF LOW-ENERGY (LESS-THAN-160-KEV) X-RAY-SPECTRA AND VERIFICATION OF TRANSPORT CALCULATIONS THROUGH SILICON

Authors
TURINETTI JR CRITCHFIELD KL CHAVEZ JR KEMP WT BELLEM RD BEUTLER DE
Citation
Jr. Turinetti et al., DETERMINATION OF LOW-ENERGY (LESS-THAN-160-KEV) X-RAY-SPECTRA AND VERIFICATION OF TRANSPORT CALCULATIONS THROUGH SILICON, IEEE transactions on nuclear science, 44(6), 1997, pp. 2065-2070
Citations number
10
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
2065 - 2070
Database
ISI
SICI code
0018-9499(1997)44:6<2065:DOL(XA>2.0.ZU;2-G
Abstract
X-ray spectroscopy discrepancies at measured energies below 50 keV are shown through ITS detector response calculations to be caused by germ anium K edge escape peak losses. Accounting for this detector response , CEPXS/ONELD transport calculations through silicon agree well with m easurements.