SIMULATION OF IN-FLIGHT ESD ANOMALIES TRIGGERED BY PHOTOEMISSION, MICROMETEOROID IMPACT AND PRESSURE PULSE

Citation
L. Levy et al., SIMULATION OF IN-FLIGHT ESD ANOMALIES TRIGGERED BY PHOTOEMISSION, MICROMETEOROID IMPACT AND PRESSURE PULSE, IEEE transactions on nuclear science, 44(6), 1997, pp. 2201-2208
Citations number
16
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
2201 - 2208
Database
ISI
SICI code
0018-9499(1997)44:6<2201:SOIEAT>2.0.ZU;2-J
Abstract
Energetic electrons encountered in space produce electrostatic dischar ges (ESD) resulting from potential growth of dielectrics up to the bre akdown threshold. Materials with very high threshold are often conside red as rather safe towards ESD. In-flight observed anomalies and exper imental results presented in this paper show that discharges can be ob tained for potential lower than the threshold by triggering events as photon illumination, micrometeoroid impacts or pressure and plasma pul se.