AlGaAs/GaAs heterojunction bipolar transistors are investigated via ti
me-resolved and time-integrated laser induced charge-collection measur
ements and by two-dimensional computer simulation. Both experiment and
simulation results suggest that charge collection occurs by a simple
model in which carriers created by the ionizing event are collected at
the device terminals, with no evidence for charge enhancement process
es. The charge-collection efficiency in all cases is less than unity,
with the collected charge exhibiting a linear dependence on the deposi
ted charge for all laser wavelengths used (below the saturation limit)
. The simulation results reveal that the fast and slow contributions t
o the charge collection transient arise from electron and hole collect
ion, respectively, with the lower mobility of the holes giving rise to
their slower collection dynamics.