SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS

Authors
KOGA R PENZIN SH CRAWFORD KB CRAIN WR MOSS SC PINKERTON SD LALUMONDIERE SD MAHER MC
Citation
R. Koga et al., SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2325-2332
Citations number
9
Categorie Soggetti
Nuclear Sciences & Tecnology","Engineering, Eletrical & Electronic
Journal title
IEEE transactions on nuclear science → ACNP
ISSN journal
00189499
Volume
44
Issue
6
Year of publication
1997
Part
1
Pages
2325 - 2332
Database
ISI
SICI code
0018-9499(1997)44:6<2325:SEU(SD>2.0.ZU;2-R
Abstract
The single event upset (SEU) sensitivity of certain types of linear mi crocircuits is strongly affected by bias conditions. For these devices , a model of upset mechanism and a method for SEU control have been su ggested.