R. Koga et al., SINGLE EVENT UPSET (SEU) SENSITIVITY DEPENDENCE OF LINEAR INTEGRATED-CIRCUITS (ICS) ON BIAS CONDITIONS, IEEE transactions on nuclear science, 44(6), 1997, pp. 2325-2332
The single event upset (SEU) sensitivity of certain types of linear mi
crocircuits is strongly affected by bias conditions. For these devices
, a model of upset mechanism and a method for SEU control have been su
ggested.