D. Cousineau et S. Larochelle, PASTIS - A PROGRAM FOR CURVE AND DISTRIBUTION ANALYSES, Behavior research methods, instruments, & computers, 29(4), 1997, pp. 542-548
Reaction time (RT) data afford different types of analyses. One type o
f analysis, called ''curve analysis,'' can be used to characterize the
evolution of performance at different moments over the course of lear
ning. By contrast, distribution analysis aims at characterizing the sp
read of RTs at a specific moment. Techniques to deduce free parameters
are described for both types of analyses, given an a priori choice of
the curve or distribution one wants to fit, along with statistical te
sts of significance for distribution analysis: The log Likelihood tech
nique is used if the probability density function is given; otherwise,
a root-mean-square-deviation minimization technique is used. A progra
m-PASTIS-that searches for the optimal parameters of the following cur
ves is presented: power law, exponential, and e-based exponential. PAS
TIS also searches for Weibull and the ex-Gaussian distributions. Some
tests of the software are presented.