A RING CIRCUIT FOR THE DETERMINATION OF DYNAMIC ERROR RATES IN HIGH-TEMPERATURE SUPERCONDUCTOR RSFQ CIRCUITS

We have designed and simulated a circuit for the experimental determin ation of the rate of dynamic switching errors in high-temperature supe rconductor RSFQ circuits. The proposal is that a series-connected pair of Josephson junctions is read out by SFQ pulses circulating in a rin g-shaped Josephson transmission line at high frequency. Suitable bias currents determine the switching thresholds of the junction pair. By m easuring the voltage across the transmission line, it is proposed that the occurrence of a switching error can be detected. The bit error ra te can be determined from the mean time before false switching togethe r with the SFQ circulation frequency. The circuit design allows measur ements over a wide temperature range.