OBSERVATION OF NANO-DEWETTING STRUCTURES

Citation
P. Mullerbuschbaum et al., OBSERVATION OF NANO-DEWETTING STRUCTURES, Europhysics letters, 40(6), 1997, pp. 655-660
Citations number
20
Categorie Soggetti
Physics
Journal title
ISSN journal
02955075
Volume
40
Issue
6
Year of publication
1997
Pages
655 - 660
Database
ISI
SICI code
0295-5075(1997)40:6<655:OONS>2.0.ZU;2-M
Abstract
We have studied the dewetting of thin polymer films (polystyrene) on t op of different silicon substrates. With diffuse X-ray scattering and scanning-force microscopy a high in-plane resolution was achieved. Bes ides the well-known mesoscopic dewetting structures of drops with diam eters in the range of several micrometers we detect a further morpholo gical feature. Depending on the thickness of the native silicon oxide layer, inside the dewetted areas small dimples are formed. This nano-d ewetting structure can be understood as the result of the dewetting of a remaining ultra-thin film and is compared with theoretical predicti ons of spinodal decomposition. This observation of another length scal e provides some new aspects on the molecular mechanism of polymer dewe tting.