Final product inspection of a multi-attribute product, such as in the
electronic assembly industry, involves expensive facilities. The corre
lation among attributes may be used for reducing the efforts needed fo
r screening the products; however, engineers without an appropriate st
atistical-economical analysis tools do not take risks, and they design
ate full inspection of each item. We propose a double stage inspection
program for reducing inspection efforts. Assuming that the joint dist
ribution is known, the conditional probability that a product is ''goo
d'' may be evaluated conditional upon the observation of the product's
first-stage inspected quality attributes. Then, an expected cost mini
mization is implemented in order to decide whether a second inspection
stage is required or a classification should be based solely on the f
irst inspection stage. The cost factors include inspection and false c
lassification. The method is illustrated on a real data set from a par
ticular electronic product of Motorola-Arad Ltd.