M. Riedel et al., MODELS OF ENERGY-DEPENDENCE OF THE SECONDARY-ION YIELD COMPARED WITH EXPERIMENTAL RESULTS, Rapid communications in mass spectrometry, 11(6), 1997, pp. 667-672
The energy dependence of secondary ion yield is determined both by the
(Sigmund-Thompson or Boltzmann type) energy distribution function of
the secondary (neutral) particles and by the (exponential or power law
) ionization probability. The combination of these functions results i
n four possible mathematical models of secondary ion emission. The ene
rgy distributions of monoatomic singly charged positive ions emitted f
rom pure metals and from amorphous alloys were studied experimentally.
The parameters of the secondary ion emission models were calculated b
y fitting the equations. The binding energies obtained were compared w
ith independent experimental data taken from the literature (dissociat
ion energy, enthalpy of formation). Correlation between these values s
uggests that there are different possible emission pathways for differ
ent ion species emitted from solid targets. (C) 1997 by John Wiley & S
ons, Ltd.