A. Marcano et al., 2-COLOR NEAR-FIELD ECLIPSING Z-SCAN TECHNIQUE FOR THE DETERMINATION OF NONLINEAR REFRACTION, Journal of the Optical Society of America. B, Optical physics, 14(12), 1997, pp. 3363-3367
We propose a near-field eclipsing Z-scan technique for the measurement
of nonlinear refraction of optical materials. The technique does not
require sample displacement as in previous Z-scan and eclipsing Z-scan
experiments but preserves the high sensitivity of the eclipsing Z-sca
n method and the experimental simplicity of the Z-scan technique. As a
n example of the feasibility of the new technique, the dye solution's
thermal nonlinear refraction is measured with increased sensitivity in
comparison with the Z-scan method. (C) 1997 Optical Society of Americ
a [S0740-3224(97)01212-5].