Es. Tok et al., INFLUENCE OF ARSENIC INCORPORATION ON SURFACE-MORPHOLOGY AND SI DOPING IN GAAS(110) HOMOEPITAXY, Microelectronics, 28(8-10), 1997, pp. 833-839
We have studied the relationship between the arsenic incorporation kin
etics and the surface morphology and Si doping behaviour in GaAs(110)
films grown by molecular beam epitaxy (MBE). The homoepitaxial growth
of GaAs(110) requires low substrate temperatures and high As/Ga aux ra
tios to obtain films with good surface morphology, and under these con
ditions Si doped layers exhibit n-type behaviour. At higher growth tem
peratures and lower As/Ga nux ratios, the epitaxial films are highly f
aceted and the Si doped layers are p-type. We show that this growth re
lated site switching behaviour and variation in surface morphology is
due to a decrease in the As coverage arising from a small and temperat
ure dependent incorporation coefficient of arsenic an this surface. (C
) 1997 Elsevier Science Ltd.