A single nominally lattice matched GaInAs quantum well (QW)/quantum wi
re (QWR) structure was grown by metalorganic vapor phase epitaxy (MOVP
E) in V-grooved InP substrates. Different SiO2 etch masks with opening
widths from 2 mu m down to 200 nm (for application as second order DF
B grating) were defined by optical and electron beam lithography. A da
mage-reduced wet chemical etching process enables the growth of the Ga
InAs QWs/QWRs without any InP buffer layer. In low temperature photolu
minescence we found improved intensity for all wire structures prepare
d by this etching technique. A reduction of the period and opening wid
th of the V-groove etch mask resulted in a optimized luminescence inte
nsity ratio between QW and QWR. Decay times from time resolved lumines
cence measurements were compared to the decay times of wet or dry etch
ed mesa wires before and after regrowth. The good optical properties o
f the GaInAs QWRs are encouraging for future application as a QWR-lase
r device. (C) 1997 Elsevier Science Ltd.