STRAINED-LAYER PIEZOELECTRIC SEMICONDUCTOR-DEVICES

Authors
Citation
Gj. Rees, STRAINED-LAYER PIEZOELECTRIC SEMICONDUCTOR-DEVICES, Microelectronics, 28(8-10), 1997, pp. 957-967
Citations number
31
Journal title
ISSN journal
00262692
Volume
28
Issue
8-10
Year of publication
1997
Pages
957 - 967
Database
ISI
SICI code
0026-2692(1997)28:8-10<957:SPS>2.0.ZU;2-9
Abstract
III-V semiconductors are piezoelectric. Quantum wells grown pseudomorp hically strained on the (111) face are axially polarized and include s trong, built-in de electric fields. The associated loss of inversion s ymmetry in the wells has important consequences for the electrooptic p roperties of these structures. They can be exploited to improve the pe rformance of a number of existing optoelectronic devices and also to g enerate new ones. In this paper we review some of these properties and discuss the work at Sheffield investigating the prospects for improve d performance and novel devices in the strained InGaAs/AlGaAs/GaAs and InGaAs/InAlAs/InP systems. (C) 1997 Elsevier Science Ltd.