InP(100) is a promising substrate for microelectronic and optoelectron
ic devices due to its high mobility. Sb atomic condensation induces th
e formation of some InSb overlayers that produce passivation of the su
rface. First steps of the mechanism have been studied at atomic scale
using synchrotron radiation. The process of InSb formation is due to a
3D-2D phase transformation, In this work we also point out the effect
of the sample heating. Results are in good agreement with previous on
es obtained by Auger electron spectroscopy (AES) and electron energy l
oss spectroscopy (EELS). We have obtained a good stabilization of the
surface with respect to any prolonged heating up to 450 degrees C. The
size of the In or Sb clusters decreases with temperature: the InSb mo
nolayer becomes almost stoichiometric at 450 degrees C. The substrate
has also a good quality for an optimum behavior of electronic componen
ts (L. Bideux, B. Gruzza, A. Porte and H. Robert, Surf. Interface Anal
., 20 (1993) 803-807). (C) 1997 Elsevier Science S.A.