X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS

Authors
DRESSLER L GOETZ K KRAUSSLICH J
Citation
L. Dressler et al., X-RAY DOUBLE DIFFRACTION (UMWEGANREGUNG) IN SIC MONOCRYSTALS, Physica status solidi. b, Basic research, 200(2), 1997, pp. 377-383
Citations number
26
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. b, Basic research → ACNP
ISSN journal
03701972
Volume
200
Issue
2
Year of publication
1997
Pages
377 - 383
Database
ISI
SICI code
0370-1972(1997)200:2<377:XDD(IS>2.0.ZU;2-X
Abstract
Weak reflections are useful for the refinement of crystal structures b ecause they are sensitive to certain structural changes and do not req uire extinction corrections. Double reflections due to umweganregung s hould be suppressed since they give extraneous signals. A theoretical and experimental determination of double reflections (four-beam case) is required to find angular positions where they do not occur.