H. Watanabe et S. Katagiri, SUBSPACE METHOD FOR MINIMUM ERROR PATTERN-RECOGNITION, IEICE transactions on information and systems, E80D(12), 1997, pp. 1195-1204
In general cases of pattern recognition, a pattern to be recognized is
first represented by a set of features and the measured values of the
features are then classified. Finding features relevant to recognitio
n is thus an important issue in recognizer design. As a fundamental de
sign framework that systematically enables one to realize such useful
features, the Subspace Method (SM) has been extensively used in variou
s recognition tasks. However. this promising methodological framework
is still inadequate. The discriminative power of early versions was no
t very high. The training behavior of a recent discriminative version
called the Learning Subspace Method has not been fully clarified due t
o its empirical definition, though its discriminative power has been i
mproved. To alleviate this insufficiency, we propose in this paper a n
ew discriminative SM algorithm based on the Minimum Classification Err
or/Generalized Probabilistic Descent method and show that the proposed
algorithm achieves an optimal accurate recognition result, i.e., the
(at least locally) minimum recognition error situation, in the probabi
listic descent sense.