TEMPERATURE CHARACTERISTICS STUDIES OF NANOCRYSTALLITE SRTIO3 GRAIN-BOUNDARIES BY X-RAY PHOTOELECTRON-SPECTROSCOPY

Authors
Citation
Zx. Liu et al., TEMPERATURE CHARACTERISTICS STUDIES OF NANOCRYSTALLITE SRTIO3 GRAIN-BOUNDARIES BY X-RAY PHOTOELECTRON-SPECTROSCOPY, Chinese Physics Letters, 14(12), 1997, pp. 928-931
Citations number
6
Journal title
ISSN journal
0256307X
Volume
14
Issue
12
Year of publication
1997
Pages
928 - 931
Database
ISI
SICI code
0256-307X(1997)14:12<928:TCSONS>2.0.ZU;2-I
Abstract
Strontium titanate (SrTiO3) nanocrystallite thin films have been studi ed by x-ray photoelectron spectroscopy st different temperature. The s urface oxygen concentration and Ti/Sr ratio increase with temperature rising up to 700K, and then decrease. New Ols and Ti 3d peaks appear a t the low binding energy side of the corresponding main peaks, these n ew peaks have some different features from the corresponding main peak s, this phenomenon was not observed in single crystal SrTiO3. A model is proposed to explain this interesting phenomenon.