LOW FIELD-INDUCED ELECTRON-EMISSION PHENOMENON OBSERVED FROM THE CARBON-CONTAINING THIN-FILMS

Stable cold-cathode electron emission at fields as low as 3 MV/m has b een observed from two types of carbon-containing thin film of thicknes s in submicron scale, i. e., non-doped fullerene C-60 and amorphous di amond films. A transparent anode imaging technique was used to record the spatial distribution of individual sites and the total emission cu rrent-voltage characteristic of the films. It is found that supplement al measurements of optical spectra and electrical conductivity of the films can provide important evidence useful for understanding the diff erences in emission behaviour between two types of film.