PHOTOELECTRON SPECTROSCOPIC STUDY OF X-RAY-INDUCED REDUCTION OF CEO2

Citation
Mvr. Rao et T. Shripathi, PHOTOELECTRON SPECTROSCOPIC STUDY OF X-RAY-INDUCED REDUCTION OF CEO2, Journal of electron spectroscopy and related phenomena, 87(2), 1997, pp. 121-126
Citations number
20
ISSN journal
03682048
Volume
87
Issue
2
Year of publication
1997
Pages
121 - 126
Database
ISI
SICI code
0368-2048(1997)87:2<121:PSSOXR>2.0.ZU;2-M
Abstract
XPS technique is used to study the modification induced in CeO2 on exp osure to Al K-alpha X-rays. A study of Ce (3d) and O (Is) spectra of s intered and unsintered pellets of ceria with X-ray exposure time is ca rried out to investigate the effect of hydroxyl species on X-ray induc ed reduction of CeO2. After prolonged exposure to X-rays, a colour cha nge is observed on the sample surface of the unsintered pellet. Result s show that the reduction of ceria to sub-stoichiometric oxides occurs at a faster rate in the unsintered pellet on X-ray irradiation. (C) 1 997 Elsevier Science B.V.