Jm. Gonzalezcalbet et S. Nicolopoulos, ELECTRON CRYSTALLOGRAPHY OF ZEOLITES - STRUCTURE INFORMATION FROM HREM IMAGES AND ELECTRON-DIFFRACTION PATTERNS, Solid state ionics, 101, 1997, pp. 975-983
High resolution electron microscope (HREM) images of zeolites have typ
ically been used for crystal structure interpretation of frameworks. O
nly under strict conditions (weak phase object approximation), do HREM
images represent directly the projected framework potential, otherwis
e the images are distorted. A large part of those distortions can be d
etermined and compensated for by crystallographic image processing (CI
P). This technique has been used to show that new zeolites SSZ-25 and
porosil ITQ-1 are isomorphous to the MCM-22 zeolite. CIP and filtering
can also be useful in HREM images of zeolite crystals doped with smal
l particles, revealing directly the size and distribution of particles
lying on the surface of zeolite matrix.