We describe recent measurements carried out in well controlled and rep
roducible conditions to help understanding the factors affecting the s
hort-and long-term behaviour of Microstrip Gas Chambers. Special care
has been taken concerning the gas purity and choice of materials used
in the system and for the detectors construction. Detectors built on g
lasses with surface resistivity in the range 10(13)-10(15) Ohm/square
have shown satisfactory performance as they do not show charging-up pr
ocess at high rate and stand the large doses required for the future h
igh luminosity experiments (similar to 10 mC.cm(-1).yr(-1)). Concernin
g the lifetime measurements, it has been observed that chambers manufa
ctured on high-resistivity glass are far more susceptible of suffering
ageing than detectors made on low resistivity, electron-conducting su
pports, independently of the metal used for the artwork (chromium or g
old) at least in clean gas conditions. The successfully operation in t
he laboratory of detectors manufactured on diamond-coated glass with a
surface resistivity around 10(15) Ohm/square confirms the last statem
ent. Results-from a long-term, high rate beam test are also reported.