EVALUATION OF MERCURIC IODIDE CERAMIC SEMICONDUCTOR-DETECTORS

Citation
M. Schieber et al., EVALUATION OF MERCURIC IODIDE CERAMIC SEMICONDUCTOR-DETECTORS, Nuclear physics. B, 1998, pp. 321-329
Citations number
14
Categorie Soggetti
Physics, Particles & Fields
Journal title
ISSN journal
05503213
Year of publication
1998
Supplement
61B
Pages
321 - 329
Database
ISI
SICI code
0550-3213(1998):<321:EOMICS>2.0.ZU;2-7
Abstract
Mercuric iodide ceramic radiation detectors, which can act as nuclear particle counters, have been fabricated with single continuos electric al contacts and with linear strip contacts. They have been tested with different kinds of gamma and beta sources as well as in a high energy beam at CERN. The detectors were also successfully tested for radiati on hardness with irradiation of 5(double dagger)10(14) neutrons/cm(2). The ratio of detected photons over the number of absorbed photons has been measured with gamma sources of different energies, and it ranges from 20% at 44 keV up to about 30% at 660 keV. An absolute efficiency of 70% has been measured for a 350 mu m thick detector for beta parti cles emitted by a Sr-90 source. Charge collection efficiency, defined as the amount of charge induced on the electrodes by a Minimum Ionizin g Particle (MIP) traversing the detector, has been measured in two sam ples. The average collected charge fits well with a linear curve with slope of 35 electrons/(kV/cm) per 100 mu m. This result is well descri bed by a dynamic device simulation, where the free carrier mean lifeti me is used as a free parameter, adjusted to a value of 1.5 ns, i.e. ab out 1/100 of the corresponding lifetime in single crystal HgI2 detecto rs. The response to MIP has also been studied with a high energy (100 GeV) muon beam in CERN. A preliminary beam profile is presented while a more detailed analysis is still in progress and will be presented el sewhere. These results together with the low cost of the material make ceramic HgI2 detectors excellent candidates for large area particle t racking and imaging applications, even in a radiation harsh environmen t.